Opintojakson tiedot

5 op

English

Not lectured every year.

This course is aiming to give an overview of advances in materials characterization methods. Through the course, students are expect to master basic characterization methods, and correlate observed phenomena to materials properties. Techniques are dedicated to determinations of morphologies and electronic structures of bulk, nano-films as well as free and deposited clusters.

The course will be focused on methods and special requirements on experimental researches in the field of materials science. The lessons and demonstration include principles related to conventional characterization methods, microscopic detections, and the latest synchrotron-radiation-based techniques. Students will be guided to practice laboratory works of the vapor deposit sample growth system, morphological, and electronic structure measurements through SEM and the XPS. The course will also cover introduction to inorganic material growth methods, requirements to select different techniques, and physical insights within materials functionalities.

Face-to-face teaching

Lectures 24 h, exercises 10 h, 2 laboratory exercises, self-study 118 h

Primarily for the students of the master program degree in physics. Also for the other students of the University of Oulu.

No specific prerequisites.

No alternative course units or course units that should be completed simultaneously.

Material Characterization techniques, by Sam Zhang, Lin Li, and Ashok Kumar, CRC press (2009); X-ray characterization of materials edited by Eric Lifshin, Wiley-VCH, (1999).

One written examination.
Read more about assessment criteria at the University of Oulu webpage.

Numerical grading scale 0 – 5, where 0 = fail

Wei Cao

No work placement period