This course is aiming to give an overview of advances in materials characterization methods. Through the course, students are expect to master basic characterization methods, and correlate observed phenomena to materials properties. Techniques are dedicated to determinations of morphologies and electronic structures of bulk, nano-films as well as free and deposited clusters.
The course will be focused on methods and special requirements on experimental researches in the field of materials science. The lessons and demonstration include principles related to conventional characterization methods, microscopic detections, and the latest synchrotron-radiation-based techniques. Students will be guided to practice laboratory works of the vapor deposit sample growth system, morphological, and electronic structure measurements through SEM, PEEM, TEM, and XPS etc. The course will also cover introduction to inorganic material growth methods, requirements to select different techniques, and physical insights within materials functionalities.
Not lectured every year
Face-to-face teaching (now online course)
Lectures 24 h, exercises 10 h, 2 laboratory exercises, self-study 118 h
Primarily for the students of the international master program degree in physics. Also for the other students of the University of Oulu.
No specific prerequisites. However, the following knowledge is recommended.
Basic knowledge in Quantum Mechanics (e.g., Mikko Saarela, 763312A/S)
Basic knowledge in atomic physics (e.g., Saana-Maija Huttula, 766326A)
Basic knowledge in accelerator and SR science (e.g., Lauri Hautala, 761675S)
Good knowledge in solid state physics (e.g., Erkki Thuneberg 763333A)
Basic knowledge in chemistry and chemical science
University level of mathematics
Good knowledge in vacuum science
|Suoritustavat ja arviointikriteerit
One written examination Read more about assessment criteria at the University of Oulu webpage.
Numerical grading scale 0 – 5, where 0 = fail
Material Characterization techniques, by Sam Zhang, Lin Li, and Ashok Kumar, CRC press (2009)
X-ray characterization of materials edited by Eric Lifshin, Wiley-VCH, (1999).